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Catalogue > LP-LV Panoply 130 nm > 1PRFile BDS Aura LV generator SMIC 130 G

1PRFile BDS Aura LV generator SMIC 130 G

PRELIMINARY

High Speed

High Density

in Symphonie LP-LV Panoply

 

Despite dynamic power reduction made possible by more advanced process nodes, the increasing complexity of designs results in a real challenge to get power consumption back in control.

To address this power challenge, a solution is to select a multiple voltage architecture with blocks running independently at different voltages depending on the operating modes. However, this demands a complete solutions for all elements of the logic design.

The solution is introduced with a complete Low Voltage Panoply of memory arrays, memory registers and standard cells by Dolphin Integration. The Low Voltage Panoply is characterized for 0.9 V for the 130 nm technological process

 

Positioning & Differentiators

positioning
deliverable

Key Benefits

  • Power reduction features
    • Flexible power routing: power ring or ring-less
    • Optional Byte write and bit-wise write capability
    • Low voltage capability
  • Flexible architecture
    • Small capacity instances
    • Wide flexibility for words and bits per word
  • Decrease of fabrication costs
    • Ultra high density: up to 40% denser than traditional memory register!
    • Designed with the uHD bit-cell from foundry
    • Mixable in the logic blocks among the rows of the density optimized standard cells HD-BTF
    • Optional High Density BIST for industrial fabrication test of instances
  • Part of the “Low Voltage Panoply”
    • spRAM Haumea LV
    • HD LV standard cell library
    • sROMet Cassiopeia LV
    • Associated and optimized Linear Regulators (LRL)
  • Optimal Design for Yield
    • Design methodology ensuring High-Yield circuits despite Mismatch

 

Available modes and add-ons

Byte mode - optional
For more flexibility towards ultimate power savings, the capability of Byte-mode can be implemented in the RAM for write operations.

HD BIST - optional
The most efficient testing solution for industrial fabrication test of instances.


Flexibility

Generator flexibility
Min
Max
Granularity
Memory Bit Capacity
128
64 k
NA
Number of Words
4
2 k
2
Number of Bits per Word
8
128
2

 

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